Effect of Precursor Concentration and Annealed Substrate Temperature on the Crystal Structure, Electronic and Optical Properties of ZnO thin film
Yus Rama Denny Muchtar, Teguh Firmansyah, Adhitya Trenggono, Danu Wijaya, Ganesha Antarnusa, Andri Suherman
J. Pure App. Chem. Res. Vol 9, No 1 (2020), pp.
Submitted: November 17, 2019     Accepted: April 19, 2020     Published: April 27, 2020

Abstract



This study carried out on the effect of precursor concentration and annealed substrate temperature on the crystal structure, electronic and optical properties of ZnO thin film. An aqueous solution of nitric acid was used as precursors and its concentration was varied from 0.1 M to 0.4 M. The ZnO thin film was deposited on the glass substrate by Spray Pyrolysis Deposition and annealed with different temperature from 300 oC to 600 oC. The crystal structure, electronic and optical properties were investigated by Scanning Electron Microscopy (SEM), X-ray diffraction (XRD) and UV-Spectrometer. XRD result showed that all thin films have amorphous hexagonal wurtzite crystalline. Particle sizes ranging from 21.83 to 43.67 nm were calculated through Debye-Scherer Method. It showed that concentration of the precursor had slightly impact to the particle size. Meanwhile, the increase in particle size with increasing annealed temperature is found to be gradual. The average transparent of all thin film was more than 80%. The band gap of the ZnO thin films were estimated by Tauc Plot Relation. It showed that the band gap values were increased with the increasing of precursor concentration due to Burstein-Moss Effect. In addition, the decrease in band gap values was found with increasing annealed temperature. Our results demonstrated that the varying precursor concentration and annealed substrate temperature can enhance the structure, electronic and the optical properties of ZnO thin films.


Keywords : ZnO thin films, concentration precursors, annealed temperature, spray pyrolysis


References


[1] G. Wisz, I. Virt, P. Sagan, P. Potera, and R. Yavorskyi, “Structural, Optical and Electrical Properties of Zinc Oxide Layers Produced by Pulsed Laser Deposition Method,” Nanoscale Res. Lett., vol. 12, no. 1, p. 253, Dec. 2017.

[2] P. F. Carcia, R. S. McLean, M. H. Reilly, and G. Nunes, “Transparent ZnO thin-film transistor fabricated by rf magnetron sputtering,” Appl. Phys. Lett., vol. 82, no. 7, pp. 1117–1119, Feb. 2003.

[3] W. J. Jeong, S. K. Kim, and G. C. Park, “Preparation and characteristic of ZnO thin film with high and low resistivity for an application of solar cell,” Thin Solid Films, vol. 506–507, pp. 180–183, May 2006.

[4] L. C. Nehru, M. Umadevi, and C. Sanjeeviraja, “Studies on structural, optical and electrical properties of ZnO thin films prepared by the spray pyrolysis method,” Int. J. Mater. Eng., vol. 2, no. 1, pp. 12–17, 2012.

[5] P. Nunes, B. Fernandes, E. Fortunato, P. Vilarinho, and R. Martins, “Performances presented by zinc oxide thin films deposited by spray pyrolysis,” Thin Solid Films, vol. 337, no. 1–2, pp. 176–179, 1999.

[6] N. L. Tarwal and P. S. Patil, “Superhydrophobic and transparent ZnO thin films synthesized by spray pyrolysis technique,” Appl. Surf. Sci., vol. 256, no. 24, pp. 7451–7456, Oct. 2010.

[7] G. K. Mani and J. B. B. Rayappan, “A highly selective room temperature ammonia sensor using spray deposited zinc oxide thin film,” Sens. Actuators B Chem., vol. 183, pp. 459–466, Jul. 2013.

[8] C. Chen, E. M. Kelder, P. J. J. M. van der Put, and J. Schoonman, “Morphology control of thin LiCoO2 films fabricated using the electrostatic spray deposition (ESD) technique,” J. Mater. Chem., vol. 6, no. 5, p. 765, 1996.

[9] H. P. Klug and L. E. Alexander, “X-ray diffraction procedures: for polycrystalline and amorphous materials,” X-Ray Diffr. Proced. Polycryst. Amorph. Mater. 2nd Ed. Harold P Klug Leroy E Alexander Pp 992 ISBN 0-471-49369-4 Wiley-VCH May 1974, p. 992, 1974.

[10] K. Prabakaran and L. Amalraj, “Studies on zinc oxide thin films by chemical spray pyrolysis technique,” Int. J. Phys. Sci., vol. 9, no. 11, pp. 261–266, Jun. 2014.

[11] Y. R. Denny et al., “Effects of cation compositions on the electronic properties and optical dispersion of indium zinc tin oxide thin films by electron spectroscopy,” Mater. Res. Bull., vol. 62, pp. 222–231, 2015.

[12] Y. Rama Denny et al., “Effects of gas environment on electronic and optical properties of amorphous indium zinc tin oxide thin films,” J. Vac. Sci. Technol. Vac. Surf. Films, vol. 31, no. 3, p. 031508, 2013.

[13] C. Supatutkul, S. Pramchu, A. P. Jaroenjittichai, and Y. Laosiritaworn, “Electronic properties of two-dimensional zinc oxide in hexagonal, (4,4)-tetragonal, and (4,8)-tetragonal structures by using Hybrid Functional calculation,” J. Phys. Conf. Ser., vol. 901, p. 012172, Sep. 2017.

[14] A. B. M. A. Ashrafi et al., “Growth and characterization of hypothetical zinc-blende ZnO films on GaAs(001) substrates with ZnS buffer layers,” Appl. Phys. Lett., vol. 76, no. 5, pp. 550–552, Jan. 2000.

[15] R. C. Pawar and C. S. Lee, “Chapter 3 - Heterogeneous Photocatalysts Based on Organic/Inorganic Semiconductor,” in Heterogeneous Nanocomposite-Photocatalysis for Water Purification, R. C. Pawar and C. S. Lee, Eds. Boston: William Andrew Publishing, 2015, pp. 43–96.


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